The Measurement of Grain Boundary Geometry(Series in Microscopy in Materials Science)

物理学史

原   价:
3067.00
售   价:
2300.00
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平台大促 低至8折优惠
发货周期:预计5-7周发货
作      者
出  版 社
出版时间
1993年06月01日
装      帧
精装
ISBN
9780750302357
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页      码
182
开      本
6-1/8 x 9-1/4
语      种
英文
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图书简介
Studying material properties from their geometrical measurements, The Measurement of Grain Boundary Geometry provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. The book presents an overview of the developments in the theory of grain boundary geometry and its practical applications in material engineering. It also covers the tunneling electron microscope (TEM), experimental aspects of data collection, data processing, and examples from actual investigations. Each step of the analysis process is clearly described, from data collection through processing, analysis, representation, and display to applications.
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